{"product_id":"9781032375106","title":"Advanced Materials Characterization (Advanced Materials Processing And Manufacturing)","description":"The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.\u003cbr\u003e\u003cbr\u003e\u003cbr\u003e\u003cul\u003e\n\u003cli\u003e| \u003cb\u003eAuthor: \u003c\/b\u003eCh Sateesh. Singh Kumar (M Muralidhar. Krishna, Ram.), M Muralidhar Singh, Ram Krishna\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003ePublisher: \u003c\/b\u003eCrc Press\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003ePublication Date: \u003c\/b\u003eMay 04, 2023\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003eNumber of Pages: \u003c\/b\u003e130 pages\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003eLanguage: \u003c\/b\u003eEnglish\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003eBinding: \u003c\/b\u003eHardcover\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003eISBN-10: \u003c\/b\u003e1032375108\u003c\/li\u003e\n\u003cli\u003e| \u003cb\u003eISBN-13: \u003c\/b\u003e9781032375106\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Crc Press","offers":[{"title":"Default Title","offer_id":47926626058545,"sku":"9781032375106","price":162.12,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0798\/8215\/8385\/products\/9781032375106.jpg?v=1702474469","url":"https:\/\/www.recomparo.com\/es\/products\/9781032375106","provider":"ReComparo.com","version":"1.0","type":"link"}