Routledge
Applied Measurement With Jmetrik
Applied Measurement With Jmetrik
ISBN-13: 9780415531979
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Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.
- | Author: J. Patrick Meyer
- | Publisher: Routledge
- | Publication Date: Jun 30, 2014
- | Number of Pages: 170 pages
- | Language: English
- | Binding: Paperback
- | ISBN-10: 0415531977
- | ISBN-13: 9780415531979
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