Iop Publishing Ltd
Quantum Metrology With Photoelectrons: Analysis Methodologies (Iop Ebooks)
Quantum Metrology With Photoelectrons: Analysis Methodologies (Iop Ebooks)
ISBN-13: 9780750350204
Precio habitual
$223.49
Precio habitual
Precio de oferta
$223.49
Precio unitario
/
por
Los gastos de envío se calculan en la pantalla de pago.
No se pudo cargar la disponibilidad de retiro
The overall aim of Quantum Metrology with Photoelectrons Vol. 3 is to expand, explore, and illustrate new computational developments in quantum metrology with photoelectrons: specifically, the application of new python-based tools to tackle general problems in photoionization matrix element retrieval. Part I details the topic, theory and computational methods; Part II provides further numerical details and case-studies, specifically employing the generalised bootstrap retrieval protocol, which makes use of rotational wavepackets as a geometric control parameter. Problems of various size and difficulty are investigated, with the largest for an asymmetric top with 38 complex matrix elements (equivalently, a 38x38 density matrix retrieval). Key Features: Interpreting experimental data. Extraction/reconstruction/determination of quantum mechanical properties (matrix elements, wavefunctions, density matrices) from experimental data. Comparison of experimental and theoretical data. New analysis methodologies & techniques. Introduction to newly-developed software platforms
- | Author: Paul Hockett|Varun Makhija
- | Publisher: Iop Publishing Ltd
- | Publication Date: Dec 29, 2023
- | Number of Pages: 226 pages
- | Language: English
- | Binding: Hardcover
- | ISBN-10: 0750350202
- | ISBN-13: 9780750350204
Share
