Advanced Materials Characterization (Advanced Materials Processing And Manufacturing)

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

• | Author: Ch Sateesh. Singh Kumar (M Muralidhar. Krishna, Ram.), M Muralidhar Singh, Ram Krishna
• | Publisher: Crc Press
• | Publication Date: May 04, 2023
• | Number of Pages: 130 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 1032375108
• | ISBN-13: 9781032375106