Materials Reliability In Microelectronics Iii: Volume 309 (Mrs Proceedings)

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

• • Author: Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho
• • Publisher: Cambridge University Press
• • Publication Date: Jun 05, 2014
• • Number of Pages: 514 pages
• • Language: English
• • Binding: Paperback
• • ISBN-10: 1107409489
• • ISBN-13: 9781107409484