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Routledge

Applied Measurement With Jmetrik

Applied Measurement With Jmetrik

ISBN-13: 9780415531979
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Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.


  • | Author: J. Patrick Meyer
  • | Publisher: Routledge
  • | Publication Date: Jun 30, 2014
  • | Number of Pages: 170 pages
  • | Language: English
  • | Binding: Paperback
  • | ISBN-10: 0415531977
  • | ISBN-13: 9780415531979
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