Materials Reliability In Microelectronics Ii: Volume 265 (Mrs Proceedings)

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

• • Author: C. V. Thompson, J. R. Lloyd
• • Publisher: Cambridge University Press
• • Publication Date: Jun 05, 2014
• • Number of Pages: 344 pages
• • Language: English
• • Binding: Paperback
• • ISBN-10: 1107409683
• • ISBN-13: 9781107409682